Archiv Imaging & Microscopy

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Ausgabe 01/2002

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Erscheinungsdatum: 08.04.2002

Advanced light microscopy

Near-field Optical Imaging Using an Apertureless Microscope

Alexandra Fragola

Seite 05

Award

Microscopy Award 2002

Olympus and GIT combine to launch Microscopy Award 2002 - inspiring and rewarding communications on microscopy

Seite 07

Confocal laser scanning microscopy

Going New Ways in Confocal Multifluorescence Imaging

Emission Fingerprinting with the LSM 510 META

Bernhard Zimmermann

Seite 08

Review Electron Microscopy

ImarisSurpass

The Power of Interactive Data Investigation

Bitplane AG

Seite 012

Cover Story

Extended Application Range for a High-End SEM

J.J.L. Muders

Seite 014

Low light imaging

Combined Luminescence, Fluorescence and Brightfield Multiparameter Imaging

Peter K. Djali, Glyn Nelson, David Berry, Geraint Wilde, Michael White, Mark Browne

Seite 016

FT-IR Chemical Imaging

Bernd Dippel, David Clark

Seite 020

Interview

Microscopy Under One Common European Roof

P.W. Hawkes

Seite 022

Events

Microscience 2002 - The latest Microscopy & Imaging Techniques

Seite 024

Electron Microscopy

Extend Accuracy in Site Specific Cross Sectioning and TEM Sample Preparation

Peter Gnauck

Seite 025

Software

System Integration in Image Analysis Microscopy

Part 2: Software and Hardware

Frank Sieckmann

Seite 028

Microscope automation

Recent Developments in Microscope Automation

John Wingfield

Seite 031

Image analysis

Life - a Six Dimensional View

Image processing in the Life Sciences - an Overview of Current Methods

Manfred Kässens

Seite 035

Seeing the Genome

Part 3: Automating Genetic Imaging
Gains in throughput, efficiency and imaging quality

Duncan Borthwick

Seite 038

Advanced light microscopy

Characterising Layered Structures with Third-Harmonic Generation Microscopy

J. M. Schins, G. J. Brakenhoff, M. Müller

Seite 044