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Ausgabe 02/2007

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Erscheinungsdatum: 10.06.2007

Editorial

Disney’s View on the Atomic Level

M. Friedrich, T. Matzelle, GIT VERLAG, D

Seite 01

News from EMS

EMS Newsletter

U. Aebi, N. Schryvers, EMS

Seite 10

Event Report

Advanced Light Microscopy Community in the City of Art and Science

Focus on Microscopy 2007, Valencia, 10-13 April

Prof. Dr. F. Brakenhoff, University of Amsterdam, NL

Seite 14

RMS Micrograph Competition

The RMS - Closer to Industry

A. Winton, RMS, UK

Seite 15

Announcements

"Super Congress” In Stockholm

Prof. L. Westerberg, Uppsala University, S; Prof. U. Karlsson, Royal Institute of Technology, S

Seite 16

Scanning Section

Electron Microscopy of Soft Nano-materials

Imaging in the Native State

Dr. D. J. Stokes, E. Baken, FEI Company, NL

Seite 18

Imaging Atomic-Scale Spin Structures

A Novel SPM Method Resolves Spin Structures on Insulator Surfaces

Prof. Dr. R. Wiesendanger, University of Hamburg, D

Seite 21

Functional Amyloid

Mechanical Strength Revealed by Atomic Force Microscopy

Prof. S. P. Jarvis, Dr. A. S. Mostaert, University College Dublin, IRL

Seite 25

Scanning Ion Conductance Microscopy

Imaging Technique Integrating Shear Force Distance Control

M. Böcker, Dr. T. E. Schäffer, University of Münster, D

Seite 30

Nano-Thermal Analysis

Application to Studies of Polymer Blends

N.-A. Gotzen, G. Van Assche, Vrije Universiteit Brussel, B

Seite 33

Microscopy Facilities

From Macro To Nano

Microscopy Facilities at NIBSC

R. A. Fleck, L. Berry, National Institute of Biological Standards and Control, UK

Seite 35

Electron Microscopy

The Contribution of Electron Microscopy to Health Protection

and the Development of Bio-Pharmaceutics

B. Dowsett, Health Protection Agency, Centre for Emergency Preparedness and Response, UK

Seite 38

Structural Support of Hair Cell Transduction

Freeze-fracture-etching of the Sensory Epithelia of the Inner Ear

Prof. A. Forge, UCL Ear Institute, UK

Seite 40

Aberration-corrected TEM

A New Wave of In situ Investigations in Materials Science

B. Janssens, FEI Electron Optics, NL

Seite 42

Microbial Biofilm Imaging ESEM vs. HVSEM

Complementary Information and Minimization of Artifacts

M. Fedel et al., University of Trento, I

Seite 44

Advanced Electron Microscopy in Life Sciences

Finding the Place of Interest

B. M. Humbel et al., Utrecht University, NL

Seite 48

FIB/SEM for Biological Data Mining

Focused Ion Beam (FIB) Cell Sectioning for X-ray Analysis - Part I

Prof. M. Dilani et al., University of Milano-Bicocca, I

Seite 51

Understanding Cage Diassembly

3D Cryo-electron Microscopy of Clathrin Cage Complexes

C. J. Smith et al., University of Warwick, UK

Seite 54

Light Microscopy

Huygens Remote Manager

A Web Interface for High-Volume Batch Deconvolution

A. Ponti, P. Schwarb, Friedrich Miescher Institute, CH

Seite 57

Cover Story

A New Dimension in Micro-Imaging

Carl Zeiss

Seite 59

Light Microscopy

Advanced Light Microscopy Methods:

Live Cell Imaging and High Content Screening

Dr. T. Zimmermann, Centre for Genomic Regulation (CRG), E

Seite 60

Digital In-line Holographic Microscopy

4-D Imaging of Particle Paths for Biology and Microfluidics

Prof. Dr. H. J. Kreuzer, Prof. em. Dr. M. H. M. Jericho, Dalhousie University, CDN

Seite 63

3D Upgrade for Optical Microscopes

How to Transform an Optical Microscope into a Metrology Tool

Dipl. chem. HTL M. Bossard, Schaefer-Tec, CH

Seite 66

Notes from Nikon

Fluorescence Lifetime Imaging (FLIM) on a Spectral Confocal Microscope:

The Ultimate Tool for Fluorescence Resonance Energy Transfer (FRET) Analysis

C. Keogh, Nikon UK Instruments, UK

Seite 70

Compositional Analysis

Electron Energy Loss Spectroscopy

Chemical Information at the Nanometer Scale

M.-G. Willinger, Campus Universitario de Santiago, P

Seite 72