Archiv Imaging & Microscopy

Imaging & Microscopy’s New Web Face

Dr. M. Friedrich, GIT VERLAG, Germany

Seite 1

International School of Biophysics “Antonio Borsellino”

Prof. Dr. A. Diaspro, University of Genoa, Italy

Seite 10

Seeing at the Nanoscale VI

Prof. Dr. J. Rabe, Humboldt University Berlin, Germany

Seite 12

10th International Conference on Near-field Optics

Dr. O. E. Martinez, Universidad de Buenos Aires, Argentina

Seite 12

Dynamic Microscopy 2008

Prof. Dr. G. Harms, University Würzburg, Germany

Seite 13

ELSO 2008

I. Fatscher, ELSO Office, Germany

Seite 14

Acta Microscopica

Prof. Dr. G. Gonzalez, Instituto Venezolano de Investigaciones Cientificas, Venezuela

Seite 15

EMS Newsletter 21, February 2008

Prof. Dr. D. Schryvers, Ph.D., EMAT, Department of Physics, University of Antwerp, Belgium

Seite 16

Microscience 2008 Countdown Begins

A. Winton, Royal Microscopical Society, United Kingdom

Seite 18

Photonics West 2008: Again the Biggest Event in Photonics

Dr. A. Thoss, WILEY, Dr. M. Friedrich, GIT VERLAG, Germany

Seite 20

A New Brand in Imaging

S. Ridge, Microimaging Applications Group, MAG, United States of America

Seite 24

3D Imaging of Hair

G. van Dalen et al., Unilever, The Netherlands and Unilever United Kingdom

Seite 26

C AFM and X TEM

Dr. T. Mates et al., Academy of Sciences of the Czech Republic

Seite 30

Correlative AFM and TEM of Soft Material

Dr. N. B. Matsko et al., Research Institute for Electron Microscopy (FELMI), Technical University of Graz, Switzerland

Seite 33

Bringing Live Cells into Focus

Nikon, United Kingdom

Seite 36

Superresolved Holographic Microscopy

J. García et al., University of Valencia, Spain

Seite 38

Quantum Dots, Torch Bearers Into Cells

V. Sigot, Dr. T. Jovin, Max Planck Institute for Biophysical Chemistry, Germany

Seite 40

From Molecules to Tissues

Dr. M. Faretta, A. Schué, Leica Microsystems, Germany, IEO, Italy

Seite 44

Tomographic Phase Microscopy

W. Choi et al., Massachusetts Institute of Technology, United States of America

Seite 48

A Guide to Microscope Automation

D. Henderson PhD, Prior, United Kingdom

Seite 51

FRAP

R. Underwood, Nikon, United Kingdom

Seite 56

Digital Material Analysis

Part 2

E. Ahrent, Olympus, Germany

Seite 58

At the Forefront of Research

Hitachi High-Technologies, United Kingdom

Seite 67

ELMI-Update

Dr. J. Rietdorf, FMI, Switzerland

Seite 9