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Ausgabe 02/2008

Diese Ausgabe als ePaper lesen.

Erscheinungsdatum: 02.06.2008

Editorial

Dear Reader,

Dr. T. Matzelle, Dr. M. Friedrich, GIT VERLAG, Germany

Seite 1

Events

Eventcalendar

Seite 10

Announcements

ICN+T 2008, Keystone, Colorado USA

J. Stroscio, NIST, United States of America

Seite 11

Seeing at the Nanoscale VI – the Sessions

Seite 12

Dynamic Microscopy 2008

Prof. Dr. G. Harms, Rudolf-Virchow-Center, Germany

Seite 13

Photonica Expo 2008

M. Riboni, Artenergy Publishing Srl, Italy

Seite 13

RMS Micrograph Competition

Microscience 2008 - Microscopy and Analysis at the Frontiers

A. Winton, Royal Microscopical Society, United Kingdom

Seite 14

News from EMS

EMS Newsletter 22, May 2008

Prof. Dr. N. Schryvers, EMAT, University of Antwerp, Belgium

Seite 16

Scanning

Steel Cleanliness Analysis by SEM/EDS

S. Scheller, S. Langner, Bruker AXS Microanalysis, Germany

Seite 18

Rafts Properties Revealed by AFM

S. Kasas, M.D., P.D. et al., Ecole polytechnique Féderale de Lausanne, Switzerland

Seite 22

Imaging Beyond Topography

M. Fendrich et al., University of Duisburg-Essen, Germany

Seite 25

Electrospun Polymeric Fine Fibres

Prof. Dr. V. Altstädt et al., University of Bayreuth, Germany

Seite 29

Electron Microscopy

Clinical Electron Microscopy

Dr. A. J. Schröder, University Hospital of Regensburg, Germany

Seite 32

Image Processing

Automatic Quality Control of Cereals

Dr. P. Perner, Institute of Computer Vision and Applied Computer Sciences Leipzig, Germany

Seite 36

Cover Story

Lights, Camera, Action!

E. Ahrent, Olympus, Germany

Seite 38

Light Microscopy

Deep 3D Optical Metrology

C. Oriach-Font, Technical University of Catalonia (UPC), Spain

Seite 40

Selective Harmonic Optical Microscopy

Shi-Wei Chu, National Taiwan University, Taiwan

Seite 43

M-FISH and QuantiFISH

A. Sassen, Adj. Prof. G. Brockhoff, University of Regensburg, Germany

Seite 46

Manipulating Aerosols with Light

Dr. D. McGloin, University of Dundee, United Kingdom

Seite 50

Digital Material Analysis

Fundamental Knowledge Part 3

E. Ahrent, Olympus Life Science Europe, Germany

Seite 53

Notes from Nikon

Confocal and Atomic Force Microscopy

M. Balzar, PhD, Nikon Instruments Europe BV, The Netherlands, K. Poole, JPK Instruments, Germany

Seite 56

Book Review

Science of Microscopy

Dr. T. Matzelle, GIT VERLAG, Germany

Seite 6