Archiv Imaging & Microscopy

Jahr: 2011 | 2010 | 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999

Ausgabe: 04/2008 | 03/2008 | 02/2008 | 01/2008

Suche:

Ausgabe 04/2008

Erscheinungsdatum: 23.10.2008

Editorial

10 Years of Facts and Visions

Dr. M. Friedrich, GIT VERLAG, Germany

Seite 01

Anniversary Greetings

Happy Birthday Imaging & Microscopy!

Seite 04

Crossword Puzzle

Imaging & Microscopy’s Anniversary Puzzle

Seite 010

News from EMS

EMS Newsletter 24, October 2008

Prof. Dr. N. Schryvers, EMAT, University of Antwerp, Belgium

Seite 016

Event Report

Microscopy and Microanalysis in the Land of Enchantment

J.H. Scott, NIST Microanalysis Research Group, USA

Seite 017

Focused on Aachen

14th European Microscopy Congress

Dr. A. Kusserow, Dr. M. Friedrich, GIT VERLAG, Germany

Seite 018

Announcements

36th Scottish Microscopy Symposium

Dr. L. Tetley, University of Glasgow, Scotland

Seite 023

Focus on Microscopy 2009, 5–8 April

J. Dobrucki, PhD, DSc, Jagiellonian University Krakow, Poland; Prof. Dr. G.J. Brakenhoff, University of Amsterdam, The Netherlands

Seite 024

11th International Fischer Symposium on “Microscopy in Electrochemistry”

Prof. Dr. U. Stimming, P. Bele, Technische Universität München, Germany

Seite 026

RMS im Focus

The Art of Microscopy

A. Winton, Royal Microscopical Society, United Kingdom

Seite 028

Electron Microscopy

Tracking Down the Secrets of Zeolites

Dr. M. Kässens, Olympus Soft Imaging Solutions, Germany

Seite 030

Nanomaterials for Sustainable Energy

D. Stokes et al., FEI Company, The Netherlands

Seite 034

Review Electron Microscopy

Low Voltage Scanning Electron Microscopy

Prof. H. Schatten, University of Missouri, USA

Seite 038

Review Light Microscopy

Confocal Microscopy

Prof. C.J.R. Sheppard, National University of Singapore

Seite 041

Light Microscopy

Microscopes for Interdisciplinary Research

K. Olbrich, Institute for Interdisciplinary Basic Research, Germany

Seite 045

Cover Story

Combined Precision for Non-Contact Surface Metrology

Dr. R. Artigas, Sensofar-Tech, Spain; A. Schué, Leica Microsystems, Germany

Seite 046

Scanning Section

Analysing Solar Cell Material Properties with Confocal Raman Microscopy

Dr. T. Dieing et al., WITec, Germany

Seite 050

Current-sensing AFM Study

Prof. Dr. A. Ciszewski, M. Grodzicki, University of Wrocław, Poland

Seite 052

Preparation of Cadmium Sulphide Nanoparticles

Prof. Dr. R. Çapan, University of Balıkesir, Turkey

Seite 056

Notes from Nikon

Live Cell Imaging

J. Peters, Nikon Instruments, United Kingdom

Seite 058