Dear Reader,

Dr. T. Matzelle, Dr. M. Friedrich, GIT VERLAG, Germany

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Eventcalendar

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ICN+T 2008, Keystone, Colorado USA

J. Stroscio, NIST, United States of America

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Seeing at the Nanoscale VI – the Sessions

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Dynamic Microscopy 2008

Prof. Dr. G. Harms, Rudolf-Virchow-Center, Germany

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Photonica Expo 2008

M. Riboni, Artenergy Publishing Srl, Italy

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Microscience 2008 - Microscopy and Analysis at the Frontiers

A. Winton, Royal Microscopical Society, United Kingdom

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EMS Newsletter 22, May 2008

Prof. Dr. N. Schryvers, EMAT, University of Antwerp, Belgium

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Steel Cleanliness Analysis by SEM/EDS

S. Scheller, S. Langner, Bruker AXS Microanalysis, Germany

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Rafts Properties Revealed by AFM

S. Kasas, M.D., P.D. et al., Ecole polytechnique Féderale de Lausanne, Switzerland

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Imaging Beyond Topography

M. Fendrich et al., University of Duisburg-Essen, Germany

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Electrospun Polymeric Fine Fibres

Prof. Dr. V. Altstädt et al., University of Bayreuth, Germany

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Clinical Electron Microscopy

Dr. A. J. Schröder, University Hospital of Regensburg, Germany

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Automatic Quality Control of Cereals

Dr. P. Perner, Institute of Computer Vision and Applied Computer Sciences Leipzig, Germany

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Lights, Camera, Action!

E. Ahrent, Olympus, Germany

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Deep 3D Optical Metrology

C. Oriach-Font, Technical University of Catalonia (UPC), Spain

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Selective Harmonic Optical Microscopy

Shi-Wei Chu, National Taiwan University, Taiwan

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M-FISH and QuantiFISH

A. Sassen, Adj. Prof. G. Brockhoff, University of Regensburg, Germany

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Manipulating Aerosols with Light

Dr. D. McGloin, University of Dundee, United Kingdom

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Fundamental Knowledge Part 3

E. Ahrent, Olympus Life Science Europe, Germany

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Confocal and Atomic Force Microscopy

M. Balzar, PhD, Nikon Instruments Europe BV, The Netherlands, K. Poole, JPK Instruments, Germany

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Science of Microscopy

Dr. T. Matzelle, GIT VERLAG, Germany

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