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Issue 02/2008

Read this issue as ePaper.

Release date: 06/02/2008

Editorial

Dear Reader,

Dr. T. Matzelle, Dr. M. Friedrich, GIT VERLAG, Germany

page 1

Events

Eventcalendar

page 10

Announcements

ICN+T 2008, Keystone, Colorado USA

J. Stroscio, NIST, United States of America

page 11

Seeing at the Nanoscale VI – the Sessions

page 12

Dynamic Microscopy 2008

Prof. Dr. G. Harms, Rudolf-Virchow-Center, Germany

page 13

Photonica Expo 2008

M. Riboni, Artenergy Publishing Srl, Italy

page 13

RMS Micrograph Competition

Microscience 2008 - Microscopy and Analysis at the Frontiers

A. Winton, Royal Microscopical Society, United Kingdom

page 14

News from EMS

EMS Newsletter 22, May 2008

Prof. Dr. N. Schryvers, EMAT, University of Antwerp, Belgium

page 16

Scanning

Steel Cleanliness Analysis by SEM/EDS

S. Scheller, S. Langner, Bruker AXS Microanalysis, Germany

page 18

Rafts Properties Revealed by AFM

S. Kasas, M.D., P.D. et al., Ecole polytechnique Féderale de Lausanne, Switzerland

page 22

Imaging Beyond Topography

M. Fendrich et al., University of Duisburg-Essen, Germany

page 25

Electrospun Polymeric Fine Fibres

Prof. Dr. V. Altstädt et al., University of Bayreuth, Germany

page 29

Electron Microscopy

Clinical Electron Microscopy

Dr. A. J. Schröder, University Hospital of Regensburg, Germany

page 32

Image Processing

Automatic Quality Control of Cereals

Dr. P. Perner, Institute of Computer Vision and Applied Computer Sciences Leipzig, Germany

page 36

Cover Story

Lights, Camera, Action!

E. Ahrent, Olympus, Germany

page 38

Light Microscopy

Deep 3D Optical Metrology

C. Oriach-Font, Technical University of Catalonia (UPC), Spain

page 40

Selective Harmonic Optical Microscopy

Shi-Wei Chu, National Taiwan University, Taiwan

page 43

M-FISH and QuantiFISH

A. Sassen, Adj. Prof. G. Brockhoff, University of Regensburg, Germany

page 46

Manipulating Aerosols with Light

Dr. D. McGloin, University of Dundee, United Kingdom

page 50

Digital Material Analysis

Fundamental Knowledge Part 3

E. Ahrent, Olympus Life Science Europe, Germany

page 53

Notes from Nikon

Confocal and Atomic Force Microscopy

M. Balzar, PhD, Nikon Instruments Europe BV, The Netherlands, K. Poole, JPK Instruments, Germany

page 56

Book Review

Science of Microscopy

Dr. T. Matzelle, GIT VERLAG, Germany

page 6