Archive Imaging & Microscopy

Year: 2011 | 2010 | 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999

Issue: 04/2008 | 03/2008 | 02/2008 | 01/2008

Search:

Issue 04/2008

Release date: 10/23/2008

Editorial

10 Years of Facts and Visions

Dr. M. Friedrich, GIT VERLAG, Germany

page 01

Anniversary Greetings

Happy Birthday Imaging & Microscopy!

page 04

Crossword Puzzle

Imaging & Microscopy’s Anniversary Puzzle

page 010

News from EMS

EMS Newsletter 24, October 2008

Prof. Dr. N. Schryvers, EMAT, University of Antwerp, Belgium

page 016

Event Report

Microscopy and Microanalysis in the Land of Enchantment

J.H. Scott, NIST Microanalysis Research Group, USA

page 017

Focused on Aachen

14th European Microscopy Congress

Dr. A. Kusserow, Dr. M. Friedrich, GIT VERLAG, Germany

page 018

Announcements

36th Scottish Microscopy Symposium

Dr. L. Tetley, University of Glasgow, Scotland

page 023

Focus on Microscopy 2009, 5–8 April

J. Dobrucki, PhD, DSc, Jagiellonian University Krakow, Poland; Prof. Dr. G.J. Brakenhoff, University of Amsterdam, The Netherlands

page 024

11th International Fischer Symposium on “Microscopy in Electrochemistry”

Prof. Dr. U. Stimming, P. Bele, Technische Universität München, Germany

page 026

RMS im Focus

The Art of Microscopy

A. Winton, Royal Microscopical Society, United Kingdom

page 028

Electron Microscopy

Tracking Down the Secrets of Zeolites

Dr. M. Kässens, Olympus Soft Imaging Solutions, Germany

page 030

Nanomaterials for Sustainable Energy

D. Stokes et al., FEI Company, The Netherlands

page 034

Review Electron Microscopy

Low Voltage Scanning Electron Microscopy

Prof. H. Schatten, University of Missouri, USA

page 038

Review Light Microscopy

Confocal Microscopy

Prof. C.J.R. Sheppard, National University of Singapore

page 041

Light Microscopy

Microscopes for Interdisciplinary Research

K. Olbrich, Institute for Interdisciplinary Basic Research, Germany

page 045

Cover Story

Combined Precision for Non-Contact Surface Metrology

Dr. R. Artigas, Sensofar-Tech, Spain; A. Schué, Leica Microsystems, Germany

page 046

Scanning Section

Analysing Solar Cell Material Properties with Confocal Raman Microscopy

Dr. T. Dieing et al., WITec, Germany

page 050

Current-sensing AFM Study

Prof. Dr. A. Ciszewski, M. Grodzicki, University of Wrocław, Poland

page 052

Preparation of Cadmium Sulphide Nanoparticles

Prof. Dr. R. Çapan, University of Balıkesir, Turkey

page 056

Notes from Nikon

Live Cell Imaging

J. Peters, Nikon Instruments, United Kingdom

page 058